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Escalab250 system inc electron gun
Materials Characterisation
Spectroscopy
Optical
Materials Characterisation
Electron/Ion Microscopy
Scanning
Materials Characterisation
Spectroscopy
X-ray Photoemission
Materials Characterisation
Spectroscopy
Auger
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Fluorescence Spectrometer
Materials Characterisation
Spectroscopy
Fluorescence
Force Scope F1
Materials Characterisation
Mechanical Properties
Tensometer
Frequency Comb
Sample Measurement/Analysis
Electronic
RF
FTIR Spectrometer and PMA 37 Module
Materials Characterisation
Spectroscopy
Infra-Red
Gemini Rheometer
Materials Characterisation
Mechanical Properties
Rheometer
Helium Liquifier Syst 1410 Cold Box
Infrastructure
Cryogenic
Liquefier
I-Scan - Laser Diagnostic Tool
Sample Measurement/Analysis
Laser (Order)
Characterisation (Laser)
Instron Tensile Tester
Materials Characterisation
Mechanical Properties
Tensometer
KJLC Luminos Spluttering System
Process Equipment - Physical
Thin Film Deposition
Ion Beam Deposition
Process Equipment - Physical
Thin Film Deposition
Sputterer
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Labmaster 130 Single Filter Glove Box
Process Equipment - Physical
Controlled Environment
Glove Box
Light Scattering Spectrometer
Materials Characterisation
Physical Properties
Particle Size Analysis
Maglab 9T Vibrating Sample Magnetometer
Materials Characterisation
Magnetometry
Vibrating Sample
Magneto-Optical Kerr Microscope
Materials Characterisation
Magnetometry
Kerr Effect
Maran Nmr Spectrometer
Materials Characterisation
Imaging
Magnetic Resonance
MicroDrop Analyser
Materials Characterisation
Physical Properties
Particle Size Analysis
Microwave Synthesizer
Sample Measurement/Analysis
Electronic
RF
Mobile S AFM
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Mobile S AFM
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Mobile S AFM
Materials Characterisation
Surface Probe Microscopy
Atomic Force
MultiMode AFM Microscope - M2
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope - M1
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope Control Station - M1
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope IIIa SPM Control Station - M2
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope IIIa SPM Control Station - M3
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope IV Spm Control Station
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope IV SPM Control Station - M4
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope NS4-01 SPM Control Station
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nikon Eclipse 90i
Materials Characterisation
Optical Microscopy
Fluorescence
NMR Spectrometer
Materials Characterisation
Spectroscopy
Nuclear Magnetic Resonance
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