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22 high-memory compute nodes expansion of the Computational Shared Facility (CSF) cluster
Infrastructure
IT
Workstation
Analight Bio 200 Poplarisation Interferometer
Infrastructure
IT
Data Management
Capacitance Bridge AH2700A
Sample Measurement/Analysis
Electronic
Oscilloscope
Carl Zeiss ULTRA Plus Field Emission Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
CONTINUUM OPO PANTHER
Sample Measurement/Analysis
Laser
Nanosecond
Cryogen Free Measurement System,
Infrastructure
Laboratory
Controlled Environment
Cryogenic
Materials Characterisation
Physical Properties
Thermal
Customized superconducting magnet system
Infrastructure
Laboratory
Electromagnetic Screening
Fourier Transform Infra Red (FT-IR) spectroscopy/microscopy system
Materials Characterisation
Spectroscopy
Infra-Red
Gridpp4 Manchester Tier2 hardware
Infrastructure
IT
Server
H425T2i and HX425S-36i host Computers
Infrastructure
IT
Data Management
Helium Compressor (Form part of Helium Liquifier Plant)
Infrastructure
Cryogenic
Liquefier
HX525S-12i 2U Storage Node
Infrastructure
IT
Data Management
Infiniium Oscilloscope
Sample Measurement/Analysis
Electronic
Oscilloscope
M-2000X ELLIPSOMETER
Process Equipment - Physical
Characterisation
Ellipsometry
Millennia 15, Tsunami, Empower, Spitfire Pro, HG, PulseSelect-Dual & TOPAS-C
Sample Measurement/Analysis
Laser
Picosecond
Millennia 15, Tsunami, Empower, Spitfire Pro, HG, PulseSelect-Dual & TOPAS-C
Sample Measurement/Analysis
Laser
Picosecond
Millennia 15, Tsunami, Empower, Spitfire Pro, HG, PulseSelect-Dual & TOPAS-C
Sample Measurement/Analysis
Laser
Picosecond
Millennia 15, Tsunami, Empower, Spitfire Pro, HG, PulseSelect-Dual & TOPAS-C
Sample Measurement/Analysis
Laser
Picosecond
Millennia 15, Tsunami, Empower, Spitfire Pro, HG, PulseSelect-Dual & TOPAS-C
Sample Measurement/Analysis
Laser
Picosecond
Millennia Prime 15, Tsunami 3960C-15HP, PulseSelect, Harmonixx THG
Sample Measurement/Analysis
Laser
Picosecond
Millennia Prime 15, Tsunami 3960C-15HP, PulseSelect, Harmonixx THG
Sample Measurement/Analysis
Laser
Picosecond
Model UHSAS spectrometer
Materials Characterisation
Spectrometry
Mass Spectrometry
N5230C PNA-L network analyser
Sample Measurement/Analysis
Electronic
Network Analyser
NGI-Bruker Collaboration (Dimension Fastscan System
Materials Characterisation
Spectroscopy
Optical
Nikon Microscope
Sample Measurement/Analysis
Optical
High Resolution Imaging
oosan Lynx 220LYC CNC
Plasmalab System 100 ICP65
Process Equipment - Physical
Thin Film Deposition
Ion Beam Deposition
Powerlite II 9020, Scorpion D064, Narrowscan D-R 2400 & Narrowscan D-R 3000 (reversed)
Sample Measurement/Analysis
Laser
Nanosecond
Renishaw inVia Reflex Spectrometer System - Cinzia Casiraghi Graphene
Materials Characterisation
Spectrometry
Spectrophotometry
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