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2 Servo-Electric Machines, 8862 systems
Materials Characterisation
Mechanical Properties
Load
3D Discovery
Process Equipment - Physical
Lithography
Laser (Direct-Write)
ACCUTOM-5
Agilent 7700x ICPMS System
Aquadyne DVS
Materials Characterisation
Chemical Analysis
Solids
Aquadyne DVS Water Sorption Analyser
Materials Characterisation
Surface analysis
Adsorption
Broad Energy Detector system x2
Materials Characterisation
Radiometry
Gamma Ray
Creep testing equipment
Materials Characterisation
Mechanical Properties
Load
GOM ARAMIS 3D
Haas VF-255 Machining Centre
Infrastructure
Workshop
CNC Machines
High Pressure Autoclave
Materials Characterisation
Physical Properties
Thermal
Impact 3000 Series Laser
laser
LIMS
Infrastructure
IT
Data Management
MatPrep for radionuclide bearing materials
Materials Characterisation
Physical Properties
Thermal
Nova SEM 450 - FE-SEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Olympus Lext 4000
OmniScan Eddy Current Array
Quanta 3D FEG Dual Beam
RFD Analyser for HT Youn's Modulus Measurement
Materials Characterisation
Mechanical Properties
Vibration
S-3400N & Emitech K575X
Materials Characterisation
Electron/Ion Microscopy
Scanning
SADDERS MODEL MAKER
Series 5500 AFM/SPM
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Single Mode Fibre Laser
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Spark Plasma Sintering System
Process Equipment - Physical
Controlled Environment
Furnace
T80-YHP40-106Q, 532Q, 335Q & AST100
Sample Measurement/Analysis
Laser
Nanosecond
T80-YHP40-106Q, 532Q, 335Q & AST100
Sample Measurement/Analysis
Laser
Nanosecond
T80-YHP40-106Q, 532Q, 335Q & AST100
Sample Measurement/Analysis
Laser
Nanosecond
Thermogravimetric analyser
Materials Characterisation
Surface analysis
Adsorption
TriStar 3020 Surface Area and Pore Analyzer
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