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SEM (Jeol Neoscope JCM-5000)
Materials Characterisation
Electron/Ion Microscopy
Scanning
SEM (JEOL, 6610LV)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Tensile Module
Materials Characterisation
Electron/Ion Microscopy
Scanning
TESCAN MIRA3 GMU VP Analytical FESEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Tescan Vega 3 LMU Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Topcon SM300 SEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
VT SPM
Materials Characterisation
Electron/Ion Microscopy
Scanning
X-Max 80/INCA to AZTEC upgrade
Materials Characterisation
Electron/Ion Microscopy
Scanning
X-ray detector and EBSD Camera
Materials Characterisation
Electron/Ion Microscopy
Scanning
XuM system move from Quanta 250 to Quanta 3D
Materials Characterisation
Electron/Ion Microscopy
Scanning
Zeiss Merlin FESEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Zeiss Sigma HD VP FESEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Advanced Chemicals and Materials Analysis Service (ACMA)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Atomic force microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Benchtop Scanning electron microscope (SEM) (MAN-E-BIO-11b)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Bi-Cam Scan
Materials Characterisation
Electron/Ion Microscopy
Scanning
Desktop Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Desktop Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Electronic system
Materials Characterisation
Electron/Ion Microscopy
Scanning
Field Emission Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Field Emission Scanning Electron Microscope (FESEM)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Field-Emission Gun SEM (FEGSEM), with an in-situ stage (MAN-E-MS4DE-10a)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Hitachi High-Technologies Quantax 70
Materials Characterisation
Electron/Ion Microscopy
Scanning
Leo
Materials Characterisation
Electron/Ion Microscopy
Scanning
LEO 1530 FEG Scanning Electron Microsope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Nanotek Microchemistry System
Materials Characterisation
Electron/Ion Microscopy
Scanning
Neurolabware Photon Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Materials Characterisation
Optical Microscopy
Live Cell
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