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4Probe STM
Sample Measurement/Analysis
Cryogenic
4K
Materials Characterisation
Electron/Ion Microscopy
Scanning
Materials Characterisation
Surface Probe Microscopy
Scanning Tunneling
Materials Characterisation
Surface Probe Microscopy
Magnetic Force
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Axon GenePix 4400A Scanner
Materials Characterisation
Electron/Ion Microscopy
Scanning
AZtec Energy Advanced EDS Analysis system
Materials Characterisation
Electron/Ion Microscopy
Scanning
Carl Zeiss EVO MA15 VP-SEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Carl Zeiss ULTRA Plus Field Emission Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Electron Probe MicroAnalyser
Materials Characterisation
Electron/Ion Microscopy
Scanning
Escalab250 system inc electron gun
Materials Characterisation
Spectroscopy
Optical
Materials Characterisation
Electron/Ion Microscopy
Scanning
Materials Characterisation
Spectroscopy
X-ray Photoemission
Materials Characterisation
Spectroscopy
Auger
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FEI Magellan 400SEM and Analysis System
Materials Characterisation
Electron/Ion Microscopy
Scanning
Field Ion Beam Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
HKL Premium Nordlys EBSD System
Materials Characterisation
Electron/Ion Microscopy
Scanning
Illumina iScan
Materials Characterisation
Electron/Ion Microscopy
Scanning
Ion Beam Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Materials Characterisation
Electron/Ion Microscopy
Ion Beam
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JEOL JXA-8530F Electron Probe Micro Analyser
Materials Characterisation
Electron/Ion Microscopy
Scanning
LVEM5 microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Microscope - S3400N VP SEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
MXJ10000 Neoscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Nova SEM 450 - FE-SEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Quanta 200 Scanning Electon Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Quanta 250
Materials Characterisation
Electron/Ion Microscopy
Scanning
Quanta 250FEG SEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Quanta 450FEG ESEM
Materials Characterisation
Electron/Ion Microscopy
Scanning
Quanta 650 Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
QUANTA200 scanning electron
Materials Characterisation
Electron/Ion Microscopy
Scanning
R & D EVO 50
Materials Characterisation
Electron/Ion Microscopy
Scanning
S-3400N & Emitech K575X
Materials Characterisation
Electron/Ion Microscopy
Scanning
Scanning Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
Scanning Electron Microscope Tescan
Materials Characterisation
Electron/Ion Microscopy
Scanning
SEM (FEI, Nova NanoSEM)
Materials Characterisation
Electron/Ion Microscopy
Scanning
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