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SYSTEM CONTROLLER
System for creating layered heterostructures form air sensitive 2D materials in argon environment
Process Equipment - Physical
Etching
Plasma
System for handling and encapsulating air sensitive 2D materials in argon environment
Process Equipment - Physical
Controlled Environment
Glove Box
SYSTEMS ANALYSER
T-Scan 111 equipment
Sample Measurement/Analysis
Bio-Medical
Dental
T2016-01b.25 kN SSRT
T80-YHP40-106Q, 532Q, 335Q & AST100
Sample Measurement/Analysis
Laser
Nanosecond
T80-YHP40-106Q, 532Q, 335Q & AST100
Sample Measurement/Analysis
Laser
Nanosecond
T80-YHP40-106Q, 532Q, 335Q & AST100
Sample Measurement/Analysis
Laser
Nanosecond
TA ARES
Materials Characterisation
Mechanical Properties
Rheometer
TA Instruments MDSC Thermal Analysis
Materials Characterisation
Physical Properties
Thermal
TA Instruments Q500 Thermogravimetric Analyzer with Autosampler
Materials Characterisation
Physical Properties
Thermal
TA Q5000
Materials Characterisation
Physical Properties
Thermal
Tab A7
Table Mounted Testing System
Materials Characterisation
Mechanical Properties
Tensometer
Tablet compressor
Tali Cell Counter
Sample Measurement/Analysis
Optical
High Resolution Imaging
TAPE STATION AGILENT
TapeStation
Sample Measurement/Analysis
Proteins/Nucleic Acids
Electrophoresis
Tapestation 2200 Nucleic acid analyser
Tebu-lio Ltd 188MIRUS-PUMP-EVO; 188V8CF-400-100-02P10
Process Equipment - Physical
Controlled Environment
Atmospheric Reactors
Tecan Miniprep75/2 Solution Preparation
Materials Characterisation
Chemical Analysis
Liquid Analysis
Tecan Multimode Microplate Reader
Materials Characterisation
Optical Microscopy
Live Cell
Tecan Spark 10M plate reader
Tecan Teach Spark 20M plate reader
Process Equipment - Biological
Characterisation
Plate Readers
Tecnai F30 TEM
Materials Characterisation
Electron/Ion Microscopy
Transmission
Teledyne Automated LC system for reverse phase
TeleDyne Combiflash NextGen 300+ Chromatography System
Teledyne Oscilloscope
Sample Measurement/Analysis
Electronic
Oscilloscope
Temperature controller
Materials Characterisation
Electron/Ion Microscopy
Sample Manipulation
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