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Multihead microscope
Sample Measurement/Analysis
Acoustic
Microscope
Multimode
Materials Characterisation
Surface Probe Microscopy
Atomic Force
MultiMode AFM Microscope - M2
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Multiphoton + Confocal Microscope
Materials Characterisation
Optical Microscopy
Confocal
Multiphoton Confocal
Materials Characterisation
Imaging
In Vivo Fluorescence
Multiple Excitation Dual Emission Photom
Materials Characterisation
Optical Microscopy
Fluorescence
MULTIPLEX READER
Multiprobe 2010 Inverted CLSM System
Multiscale X-Ray
Materials Characterisation
Imaging
X-ray
MVE LN2 tank
Infrastructure
Laboratory
Controlled Environment Storage
MXJ10000 Neoscope
Materials Characterisation
Electron/Ion Microscopy
Scanning
N5230C PNA-L network analyser
Sample Measurement/Analysis
Electronic
Network Analyser
Nano LC System
Materials Characterisation
Spectrometry
Mass Spectrometry
Nano RSLC chromatography system
Materials Characterisation
Chemical Analysis
Chromatography
NANO STRUCTURE SYSTEMS ANALYSER
NANO SYSTEMS ANALYSER
Nanofactory System
Materials Characterisation
Electron/Ion Microscopy
Transmission
Nanoindenter
Materials Characterisation
Mechanical Properties
Hardness
Nanoindenter Stages for SEM, FIB and X-ray
Materials Characterisation
Mechanical Properties
Hardness
NanoIR 2 system - Nano infra-red atomic force microscope
Materials Characterisation
Spectroscopy
Infra-Red
Nanonis SPM control system for Omicron RT-AFM/STM
Materials Characterisation
Surface Probe Microscopy
Atomic Force
nanoPVD Sputter and Thermal Deposition System
Nanoscope - M1
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope Control Station - M1
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope IIIa SPM Control Station - M2
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope IIIa SPM Control Station - M3
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope IV Spm Control Station
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope IV SPM Control Station - M4
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanoscope NS4-01 SPM Control Station
Materials Characterisation
Surface Probe Microscopy
Atomic Force
Nanosecond Tuneable laser, Laser safety screens, Optical Table RS2000 SeriesOptical Table, S-2000 Series 28 inchStandard Isolators with AutomaticLeveling
Sample Measurement/Analysis
Laser
Nanosecond
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