Scanning Electron Microscope
Description
Jeol 8230: dedicated electron microprobe with 5 spectrometers, EDS/EDX capabilities- for quantitative mapping and microanalysis.
ManufacturerHITACHI
ModelSU8230
Location
University of Leeds (Identifier: 1)
Contact
Academic Contact
| Mr Mr John Harrington | |
| j.p.harrington@leeds.ac.uk | |
| +44-113-34-32559 |