Allows the deposition of thin dielectric films such as silicon nitride and silicon dioxide at lower temperatures on 2D materials. These layers can be used for passivation or insulation. They can also be used as the starting substrate for device fabrication where control of thickness is vital for optical observation of 2D flakes. Facility: Yes
Ernest Hill | |
e.w.hill@manchester.ac.uk | |
+44-161-275-4552 |
Mr John Whittaker | |
John.Whittaker@manchester.ac.uk | |
+44-161-306-1432 |