Description

Atomic Force Microscope (MI) - A Molecular Instruments AFM ithat is used to acquire "in-air" or "in-liquid" AFM (Atomic Force Microscopy) images of mineral surface structure (z resolution sub angstrom x,y resolution 1-5 angstroms) in contact or tapping. Facility: Williamson Research Centre

ManufacturerMOLECULAR IMAGING

ModelMS300

Contact

Academic Contact

Professor Jonathan Lloyd
Jon.Lloyd@manchester.ac.uk
+44-161-275-7155

Technical Contact

Dr Paul Wincott
paul.wincott@manchester.ac.uk