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JEOL JEM-2010F Field Emission Electron Microscope
Materials Characterisation
Electron/Ion Microscopy
Transmission
featured
Description
Field Emission Electron Microscope
Manufacturer
JEOL
Model
JEM-2010F
Location
University of Sheffield
Materials Science and Engineering
Contact
Academic Contact
Dr Ian Ross
i.ross@sheffield.ac.uk
Technical Contact
Dr Ian Ross
i.ross@sheffield.ac.uk