Scanning Electron Microscope (GEIC ref#OR039)
Description
Sample characterisation. Facility: YES GEIC
ManufacturerHITACHI HIGH-TECHNOLOGIES EUROPE GMBH
Model
Location
Contact
Academic Contact
| Professor Ian Kinloch | |
| ian.kinloch@royce.ac.uk | |
| +44-161-306-3615 |
Technical Contact
| Mr John Whittaker | |
| John.Whittaker@manchester.ac.uk | |
| +44-161-306-1432 |