Hitachi High-Technologies TM3030 Plus Tabletop Microscope with Oxford Instruments Swift ED3000 microanalysis system

Description

Provides higher-resolution images through optimization of the electron optics system

With the newly developed tabletop microscope TM3030, benchtop type SEM, Hitachi High-Tech has improved the resolution of observed images in order to meet the needs of customers seeking to perform high-resolution observations without sample preparation. By optimizing the electron optics system, Hitachi High-Tech has provided a “5 kV mode” that enables sharper observations of the finest structures of sample surfaces, which cannot be observed at high accelerating voltages. Observations under high magnification also provide sharper, higher resolution observation images.

SWIFT ED incorporates AUTO ID for accurate element identification QUANT Auto ID set up routine Elements may be specified if required Digital Beam Control for x-ray maps and line scans (TM-3000 only)