Description

Site-specific imaging, extraction and preparation of samples (i.e.,films, oxides and defects/cracks) for TEM/EBSD analysis. Facility: no

Manufacturer

ModelHelios NanoLab 660

Location

Contact

Academic Contact

Michael Burke
michael.burke-2@manchester.ac.uk

Technical Contact

Dr Ali Gholinia
Ali.Gholinia@manchester.ac.uk
+44-161-306-5914