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N8 Research Partnership
Field-Emission Gun SEM (FEGSEM), with an in-situ stage (MAN-E-MS4DE-10a)
Materials Characterisation
Electron/Ion Microscopy
Scanning
Description
Scanning electron microscope for imaging and strain analysis (in-situ material characterisation).
Manufacturer
TESCAN-UK LTD
Model
Location
Main Campus
School of Natural Sciences
Contact
Academic Contact
Professor Frederick Currell
frederick.currell@manchester.ac.uk
Technical Contact
Mr Kevin Warren
kevin.warren@manchester.ac.uk