AZtecHKL & Nordlys Nano sensitive EBSD Camera

Description

It is an Electron Back Scatter Diffraction (EBSD) system on a FEI Sirion Field Emission Gun (FEG) Scanning Electron Microscope (SEM) and is located in A14 at the Materials Science Centre. The equipment is used for high resolution electron back scatter analysis (EBSD) analysis. Facility: n/a